for FEI Company for samples up to Ø 5 inches and a weight of up to 2 kg.
for company Zeiss for samples up to Ø 4 inches and a weight of up to 2 kg.
samples up to Ø 4 inches and a weight of up to 2 kg.
for samples up to Ø 8 inches and a weight of up to 1 kg.
assembled on top of a 5-axes-manipulator for SEM. Tensile force: 1000 kg
With this tensile module values of mechanical strain can be measured while -at the same time- changes of the sample surface can be observed in a SEM.
for scanning electron microscopes